Parcourir Fascicula VIII par sujet "atomic force microscopy (AFM)"
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Investigation of Layers Formed Through Selective Transfer with Atomic Force Microscopy
(Universitatea ”Dunărea de Jos” din Galați, 2008)Atomic force microscopy (AFM) has become a versatile tool for investigating local mechanical properties. In addition, through the AFM tip-couple interaction, it is possible to study the effects of perturbations and ...

